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    MCT-SIMTM Device Simulation Software
  
 
MCT-SIMô: High-Performance Mercury Cadmium Telluride (MCT) Device Simulator
MCT-SIM is a design tool for evaluating the performance of Mercury Cadmium Telluride (HgCdTe) diodes in photo-detection and imaging applications. MCT-SIM has been developed to help designers to simulate device performance prior to fabrication.

MCT-SIM obtains electrical and optical (photovoltaic) characteristics of HgCdTe based p-n junction devices (diodes and image sensors) exposed to Mid-wave and Long-wave Infrared (MWIR & LWIR) radiation.

MCT-SIM is the only device simulation tool that revolutionizes the design of MCT-based image sensors by bypassing and eliminating the need for cumbersome finite element software. MCT-SIM provides the ability to investigate the potential use of novel and new device structures for infrared imaging using HgCdTe material systems.

MCT-SIM provides highly accurate results in shorter computation times and simulation results have been verified with measured results of fabricated HgCdTe devices.

MCT-SIM is only available from Banpil.
 
HgCdTe DEVICE SIMULATION TOOLS  EXTRACT CHARACTERSTICS 
  • Standard MCT Materials
  • Image Sensor Devices
  • Extend from Mid- to Long-wave Infrared (MWIR & LWIR)
  • Simulation results verified with measured results  
  • Model P+/N-/N+ MCT Diodes, MCT Material Properties, Device Dimensions & Temperature
  • Photocurrent, Dark Current, Quantum Efficiency
  • Responsivity, Dynamic Resistance, Specific Detectivity
  • Noise Equivalent Temperature Difference (NEDT)  
 
MCT-SIM Physical Modeling, Calculations & Characteristics 

Physical Modeling 

  • Blackbody Radiation
  • HgCdTe Material Properties
  • P-N Junction
  • Device Dimensions
  • Device Temperature  

Calculation Parameters

  • Photocurrent / Dark Current
  • Figures of Merit
  • Quantum Efficiency
  • Responsivity
  • Dynamic Resistance
  • Specific Detectivity
  • Noise Equivalent Temperature Difference (NETD)

Compare with Measured Results

  • Compare simulation results against measured performance under various conditions
  • Correlate simulation & measured results on same graph
  • Provides accurate validation of I-V characteristics
  • Highly accurate results
  • Short computation times

Banpil’s MCT-SIM Advantages

  • Plug & Play – Install & design devices right away
  • Easy to use professional solution, better than limited in-house tools
  • Highly accurate results
  • Eliminate cumbersome and resource intensive finite-element based methods
  • Simulate performance before fabrication – significant cost savings
  • Executable on Windows Operating Systems (7, Vista, XP), Linux, and UNIX platforms
  • First-Class support, training & consulting from industry pioneer

Banpil has expertise in designing image sensors devices from near-UV to LWIR. With MCT-SIM, Banpil extends imaging beyond short wavelengths to longer wavelengths, especially to LWIR regions using standard materials.

MCT Sensor Applications


How to Get MCT-SIM Software
Evaluation copies of MCT-SIM are available. MCT-SIM is offered on a 15-day free trial period after which a full license is required. It is executable on Windows Operating Systems (7, Vista, XP), Linux, and UNIX platforms. MCT-SIM can be requested free of charge from Banpil’s website at www.banpil.com/designtools.htm.

 
   
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